Tous les ebooks de la collection "Integrated Circuits and Systems" - Springer

29 Livre(s)


Ajouter à ma liste d'envies Ultra-Low Voltage Nano-Scale Memories Masashi Horiguchi , Kiyoo Itoh , Hitoshi Tanaka Ultra-Low Voltage Nano-Scale Memories provides an in-depth discussion of the state-of-the-art nanometer and sub-1-V memory LSIs that are playing decisive roles in power conscious systems. Emerging problems between the device, circuit, and system levels are... Editeur : Springer Parution : 2007-09-04 Collection : Integrated Circuits and Systems PDF 105,49 €
Ajouter à ma liste d'envies Modern Circuit Placement Jingsheng Jason Cong , Gi-Joon Nam Modern Circuit Placement: Best Practices and Results describes advanced techniques in VLSI circuit placement which is one of the most important steps of the VLSI physical design flow. Physical design addresses the back-end layout stage of the chip design process. As... Editeur : Springer Parution : 2007-08-26 Collection : Integrated Circuits and Systems PDF 147,69 €
Ajouter à ma liste d'envies Low Power Methodology Manual Rob Aitken , David Flynn , Alan Gibbons , Kaijian Shi “Tools alone aren't enough to reduce dynamic and leakage power in complex chip designs - a well-planned methodology is needed. Following in the footsteps of the successful Reuse Methodology Manual (RMM), authors from ARM and Synopsys have written this Low Power... Editeur : Springer Parution : 2007-07-31 Collection : Integrated Circuits and Systems PDF 137,14 €
Ajouter à ma liste d'envies Feuilleter A Practical Introduction to PSL Cindy Eisner , Dana Fisman Functional veri?cation is hard. Period. No disagreement here. But why is this so? Consider today’s design ?ow: much of it is more or less automated, from RTL to netlist to layout to silicon. But all this automation depends upon having correct RTL input to start with,... Editeur : Springer Parution : 2007-06-19 Collection : Integrated Circuits and Systems PDF 147,69 €
Ajouter à ma liste d'envies Design for Manufacturability and Yield for Nano-Scale CMOS Charles Chiang , Jamil Kawa Design for Manufacturability and Yield for Nano-Scale CMOS walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process and how to address each aspect at the proper design step starting with the design and layout of standard cells and... Editeur : Springer Parution : 2007-06-15 Collection : Integrated Circuits and Systems PDF 94,94 €
Ajouter à ma liste d'envies Feuilleter SAT-Based Scalable Formal Verification Solutions Malay Ganai , Aarti Gupta Functional verification has become an important aspect of the chip design process. Significant resources, both in industry and academia, are devoted to the design complexity and verification endeavors. SAT-Based Scalable Formal Verification Solutions discusses in... Editeur : Springer Parution : 2007-05-26 Collection : Integrated Circuits and Systems PDF 105,49 €
Ajouter à ma liste d'envies Feuilleter CMOS Biotechnology Donhee Ham , Hakho Lee , Robert M. Westervelt CMOS Biotechnology reviews the recent research and developments joiningCMOS technology with biology. Written by leading researchers these chapters delve into four areas including: Microfluidics for electrical engineers CMOS Actuators CMOS Electrical... Editeur : Springer Parution : 2007-05-04 Collection : Integrated Circuits and Systems PDF 147,69 €
Ajouter à ma liste d'envies High-Performance Energy-Efficient Microprocessor Design Ram K. Krishnamurthy , Vojin G. Oklobdzija Microprocessors of today contain close to a billion transistors, while achieving the performance of super-computers just a decade ago. Designing such processors takes hundreds of people organized into large teams. High Performance Energy Efficient Microprocessor Design... Editeur : Springer Parution : 2007-04-27 Collection : Integrated Circuits and Systems PDF 105,49 €
Ajouter à ma liste d'envies Feuilleter Routing Congestion in VLSI Circuits Sachin Sapatnekar , Prashant Saxena , Rupesh S. Shelar With dramatic increases in on-chip packing densities, routing congestion has become a major problem in integrated circuit design, impacting convergence, performance, and yield, and complicating the synthesis of critical interc- nects. The problem is especially acute as... Editeur : Springer Parution : 2007-04-27 Collection : Integrated Circuits and Systems PDF 105,49 €
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