Téléchargez le livre : Next Generation HALT and HASS

Next Generation HALT and HASS

Robust Design of Electronics and Systems
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Paru le : 2016-03-11

NEXT GENERATION HALT AND HASS ROBUST DESIGN OF ELECTRONICS AND SYSTEMS A NEW APPROACH TO DISCOVERING AND CORRECTING SYSTEMS RELIABILITY RISKS Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. ...
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Description du livre

NEXT GENERATION HALT AND HASS ROBUST DESIGN OF ELECTRONICS AND SYSTEMS
A NEW APPROACH TO DISCOVERING AND CORRECTING SYSTEMS RELIABILITY RISKS
Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics of failure based robust product and process development methodology. The new methodologies challenge misleading and sometimes costly misapplication of probabilistic failure prediction methods (FPM) and provide a new deterministic map for reliability development. The authors clearly explain the new approach with a logical progression of problem statement and solutions.
The book helps engineers employ HALT and HASS by demonstrating why the misleading assumptions used for FPM are invalid. Next, the application of HALT and HASS empirical discovery methods to quickly find unreliable elements in electronics systems gives readers practical insight into the techniques.
The physics of HALT and HASS methodologies are highlighted, illustrating how they uncover and isolate software failures due to hardware–software interactions in digital systems. The use of empirical operational stress limits for the development of future tools and reliability discriminators is described.
Key features: Provides a clear basis for moving from statistical reliability prediction models to practical methods of insuring and improving reliability. Challenges existing failure prediction methodologies by highlighting their limitations using real field data. Explains a practical approach to why and how HALT and HASS are applied to electronics and electromechanical systems. Presents opportunities to develop reliability test discriminators for prognostics using empirical stress limits. Guides engineers and managers on the benefits of the deterministic and more efficient methods of HALT and HASS. Integrates the empirical limit discovery methods of HALT and HASS into a physics of failure based robust product and process development process.

À propos

Auteur
Kirk A. Gray , John J. Paschkewitz
Éditeur
Wiley
Collection
Quality and Reliability Engineering Series
Parution
2016-03-11
Pages
296 pages
EAN papier
9781118700235

Auteur(s) du livre


Defaut-Illustration Kirk A. Gray
Defaut-Illustration John J. Paschkewitz

Caractéristiques détaillées - droits

EAN PDF
9781118700204
Prix
104,39 €
Nombre pages copiables
0
Nombre pages imprimables
296
Taille du fichier
11325 Ko
Ce livre est accessible aux handicaps informations d'accessibilité
EAN EPUB
9781118700211
Prix
104,39 €
Nombre pages copiables
0
Nombre pages imprimables
296
Taille du fichier
17295 Ko
Ce livre est accessible aux handicaps informations d'accessibilité

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